Data for publication "High dopant activation in arsenic doped single-crystal CdTe thin films: Insights from MBE growth and rapid thermal processing" by Hongling Lott, Andrea T. Mathew, Matt R. Young, Alexander Goldstone, Anthony Rice, Matthew O. Reese, and Eric Colegrove for publication in APL Materials.
| Name | Size | Type | Resource Description | History |
|---|---|---|---|---|
| Data and plot for Figure 5 - Igor file | 72 KB | Document | Data and plot for Figure 5 – Hall carrier concentration (a) and (b), and activation (c) and (d) vs RTP Temperature | |
| Data and plot for Figure 4 - Igor | 43 KB | Document | Figure 4 – Representative SIMS depth profiles of As for two different growth conditions. | |
| Data and plot for Figure 2 - Igor | 50 KB | Document | Figure 2 – SIMS depth profile and associated deposition conditions for “staircase” structures. | |
| Data and Plot for Figure S1 - Igor | 68 KB | Document | Figure S1 -- SIMS measurements of As concentration for different post processing temperatures for different growth conditions. | |
| Data and plot for Figure 3 - Igor | 40 KB | Document | Figure 3 – As incorporation vs growth conditions. | |
| Data and plot for XRD inset in Figure 4 | 29 KB | Document | Figure 4 – Representative SIMS depth profiles of As for two different growth conditions. Insets: X-ray diffraction (XRD) ω-rocking curves of the CdTe(422) reflection from each as deposited sample, indicating the crystalline quality. The full width at half maximum (FWHM) was 96″ for the Cd-overpressure sample and 89″ for the no-Cd-overpressure sample. | |
| Data and Plot for Figure S2 mobility - Igor | 44 KB | Document | Figure S2 -- Charge carrier mobility vs RTP temperature for samples shown in Figure 5. | |
| SIMS profiles of samples used in the paper | 298 KB | Data | SIMS profiles of samples used in the paper. With and without Cd overpressure and rapid thermal processing at different temperatures (labeled). Data were used for Figure S1 and Figure 4. | |
| Staircase raw data - Excel | 39 KB | Data | Staircase raw data for figure 2 and figure 3 |
Submitted
• May •
21
2025
National Renewable Energy Laboratory
Cite This Dataset
Lott, Hongling, Andrea Mathew, Matt Young, Alexander Goldstone, Anthony Rice, Matthew Reese, and Eric Colegrove. 2025. "Data for "High dopant activation in arsenic doped single-crystal CdTe thin films: Insights from MBE growth and rapid thermal processing"." NREL Data Catalog. Golden, CO: National Renewable Energy Laboratory. Last updated: July 18, 2025. DOI: 10.7799/2572306.
About This Dataset
293
10.7799/2572306
Public
07/18/2025
DOE Project
Facilities
Materials & Chemical Science & Technology (MCS)
Funding Organization
Department of Energy (DOE)
Sponsoring Organization
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
Research Areas
Materials Science
License
View License
Digital Object Identifier
10.7799/2572306